Sonderforschungsbereich 616

 

  
  

 

 Publications SFB616

  Publications SFB616
201620152014201320122011201020092008200720062005200420032002
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B5
2015 F.-J. Meyer zu Heringdorf, P. Kahl, A. Makris , S. Sindermann, D. Podbiel and M. Horn-von Hoegen  
Signatures of plasmoemission in two photon photoemission electron microscopy
SPIE Proceedings 9361 (2015)
DOI: 10.1117/12.2082610
F.-J. Meyer zu Heringdorf, D. Podbiel and Ph. Kahl  
Using two photon photoemission microscopy for surface plasmon polariton devices
Proc. ALC ’15, 27p-B-5 (2015)
2014 P. Kahl, S. Wall, C. Witt, C. Schneider, D. Bayer, A. Fischer, P. Melchior, M. Horn-von Hoegen, M. Aeschlimann and F.-J. Meyer zu Heringdorf  
Normal-Incidence photoemission electron microscopy (NI-PEEM) for imaging surface plasmon polaritons
Plasmonics 9, 1401 (2014)
DOI: 10.1007/s11468-014-9756-6
S. Schumacher, F. Huttmann, M. Petrovic, C. Witt, D. F. Förster, Chi Vo-Van, J. Coraux, A. J. Martinez-Galera, V. Sessi, I. Vergara, R. Rückamp, M. Grüninger, N. Schleheck, F. Meyer zu Heringdorf, P. Ohresser, M. Kralj, T. O. Wehling and T. Michely  
Europium underneath graphene on Ir(111): Intercalation mechanism, magnetism, and band structure
Phys. Rev. B 90, 235437 (2014)
DOI: 10.1103/PhysRevB.90.235437
2013 Niemma M. Buckanie, Pierre Kirschbaum, Simon Sindermann and Frank J. Meyer zu Heringdorf  
Interaction of light and surface plasmon polaritons in Ag islands studied by nonlinear photoemission microscopy
Ultramicroscopy 130, 49 (2013)
DOI: 10.1016/j.ultramic.2013.03.007
2012 Pierre Kirschbaum, Niemma M. Buckanie and Frank-J. Meyer zu Heringdorf  
Impact of C60 adsorption on surface plasmon polaritons on self-sssembled Ag(111) islands on Si(111)
Plasmonics 7, 229 (2012)
DOI: 10.1007/s11468-011-9298-0
2011 H. Hattab, A.T. N'Diaye, D. Wall, G. Jnawali, J. Coraux, C. Busse, R. van Gastel, B. Poelsema, T. Michely, F.-J. Meyer zu Heringdorf and M. Horn-von Hoegen  
Growth temperature dependent graphene alignment on Ir(111)
Appl. Phys. Lett. 98, 141903 (2011)
DOI: 10.1063/1.3548546
2010 F.-J. Meyer zu Heringdorf, S. Sindermann, P. Kirschbaum and N.M. Buckanie  
Imaging of surfaces plasmon polariton waves in two photon photoemission microscopy
IMC 17 Conference Proceedings (2010) I11515
F.-J. Meyer zu Heringdorf and N.M. Buckanie  
Nonlinear photoemission microscopy with surface plasmon polaritons
Microsc. Microanal. 16 (Suppl 2), 2010
DOI: 10.1017/S1431927610057557
Alpha T. N'Diaye, Raoul van Gastel, Antonio J. Martinez-Galera, Johann Coraux, Hichem Hattab, Dirk Wall, Frank-J. Meyer zu Heringdorf, Micheal Horn-von Hoegen, Jose M. Gomez-Rodriguez, Bene Poelsema, Carsten Busse and Thomas Michely  
Steering the growth and watching the strain of epitaxial graphene on Iridium(111)
IMC 17 Conference Proceedings (2010) I11.4
2009 Niemma M. Buckanie and Frank-J. Meyer zu Heringdorf  
Exciton sensitive microscopy of anthracene thin films on Si(111)
Org. Electronics 10, 446 (2009)
DOI: 10.1016/j.orgel.2009.01.007
Johann Coraux, Alpha T. N’Diaye, Martin Engler, Carsten Busse, Dirk Wall, Niemma Buckanie, Frank-J. Meyer zu Heringdorf, Raoul van Gastel, Bene Poelsema and Thomas Michely  
Growth of graphene on Ir(111)
New J. Phys. 11, 023006 (2009)
DOI: 10.1088/1367-2630/11/2/023006
N.M. Buckanie, J. Göhre, P. Zhou, D. von der Linde, M. Horn-von Hoegen and F.-J. Meyer zu Heringdorf  
Space charge effects in photoemission electron microscopy using amplifed femtosecond laser pulses
J. Phys.: Condens. Matter 21, 314003 (2009)
DOI: 10.1088/0953-8984/21/31/314003
R. van Gastel, A.T. N'Diaye, D. Wall, J. Coraux, C. Busse, F.-J. Meyer zu Heringdorf, N. Buckanie, M. Horn von Hoegen, T. Michely and B. Poelsema  
Selecting a single orientation for millimeter sized graphene sheets
Appl. Phys. Lett. 95, 121901 (2009)
DOI: 10.1063/1.3225554
A. T. N'Diaye, R. van Gastel, A. J. Martinez-Galera, J. Coraux, H. Hattab, D. Wall, F.-J. Meyer zu Heringdorf, M. Horn-von Hoegen, J. M. Gomez-Rodriguez, B. Poelsema, C. Busse and T. Michely  
In situ observation of stress relaxation in epitaxial graphene
New J. Phys. 11, 113056 (2009)
DOI: 10.1088/1367-2630/11/11/113056
F.-J. Meyer zu Heringdorf and N. M. Buckanie  
Nonlinear photoemission microscopy: A tool for the plasmonic sandbox
Proc. of ALC '09, 96-99 (2009)
2008 P. Kury, K.R. Roos, D. Thien, S. Möllenbeck, D. Wall, M. Horn-von Hoegen and F.-J. Meyer zu Heringdorf  
Disorder-mediated ordering by self-interfactant effect in organic thin film growth of pentacene on silicon
Org. Electronics 9, 461 (2008)
DOI: 10.1016/j.orgel.2008.02.006
P. Kury, K.R. Roos, M. Horn-von Hoegen and F.-J. Meyer zu Heringdorf  
Absence of surface stress change during pentacene thin film growth on the Si(111)-(7×7) surface: A buried reconstruction interface
New J. Phys. 10, 023037 (2008)
DOI: 10.1088/1367-2630/10/2/023037
F.-J. Meyer zu Heringdorf  
The application of low energy electron microscopy and photoemission electron microscopy to organic thin films
J. Phys.: Condens. Matter 20, 184007 (2008)
DOI: 10.1088/0953-8984/20/18/184007
F.-J. Meyer zu Heringdorf, N.M. Buckanie, L.I. Chelaru and N. Raß  
Imaging of surface plasmon waves in nonlinear photoemission microscopy
in: EMC 2008, 14th European Microscopy Congress, pp. 737 (Springer, Berlin, 2008)
DOI: 10.1007/978-3-540-85156-1_369
2007 L.I. Chelaru and F.-J. Meyer zu Heringdorf  
In-situ monitoring of surface plasmons in single-crystalline Ag-nanowires
Surf. Sci. 601, 4541 (2007)
DOI: 10.1016/j.susc.2007.04.146
N.M. Buckanie and F.-J. Meyer zu Heringdorf  
Photoemission electron microscopy study of anthracene growth on Si(111)
Surf. Sci. 601, 1701 (2007)
DOI: 10.1016/j.susc.2007.01.045
A. Janzen, B. Krenzer, O. Heinz, P. Zhou, D. Thien, A. Hanisch, F.-J. Meyer zu Heringdorf, D. von der Linde and M. Horn-von Hoegen  
A pulsed electron gun for ultrafast electron diffraction at surfaces
Rev. Sci. Instrum. 78, 013906 (2007)
DOI: 10.1063/1.2431088
F.-J. Meyer zu Heringdorf, L.I. Chelaru, S. Möllenbeck, D. Thien and M. Horn-von Hoegen  
Femtosecond photoemission microscopy
Surf. Sci. 601, 4700-4705 (2007)
DOI: 10.1016/j.susc.2007.05.052
D. Thien, P. Kury, M. Horn-von Hoegen, F.-J. Meyer zu Heringdorf, J. van Heys, M. Lindenblatt and E. Pehlke  
Domain sensitive contrast in photoelectron emission microscopy
Phys. Rev. Lett. 99, 196102 (2007)
DOI: 10.1103/PhysRevLett.99.196102
2006 L.I. Chelaru, M. Horn-von Hoegen, D. Thien and F.-J. Meyer zu Heringdorf  
Fringe fields in nonlinear photoemission microscopy
Phys. Rev. B 73, 115416 (2006)
DOI: 10.1103/PhysRevB.73.115416
L.I. Chelaru and F.-J. Meyer zu Heringdorf  
Three-dimensional size determination of particles with photoelectron emission microscopy
Appl. Phys. Lett. 89, 241908 (2006)
DOI: 10.1063/1.2404968
2005 G.E. Thayer, J.T. Sadowski, F.-J. Meyer zu Heringdorf, T. Sakurai and R.M. Tromp  
The role of surface electronic structure in thin film molecular ordering
Phys. Rev. Lett. 95, 256106 (2005)
DOI: 10.1103/PhysRevLett.95.256106
2004 F.-J. Meyer zu Heringdorf and A.C. Belton  
Flexible microprocessor-based evaporation controller
Rev. Sci. Instrum. 75, 5288 (2004)
DOI: 10.1063/1.1818911
Mon 21.8.2017 6:23

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